Instrumentation and Techniques
IT1 - Advances in sample preparation techniques
Evolution of the sample preparation methods and instrumentation runs parallel with the evolution of modern microscopy and image processing. Resolution and other capabilities of microscopes are solidly improving, setting new requirements for the preparation process. This session focuses on recent developments in sample preparation methods ranging from Focused Ion Beam (FIB) to ultramicrotomy, including various applications in different disciplines of science and technology.
– György Zoltán Radnóczi, Centre for Energy Research, Hungarian Academy of Sciences, Budapest Hungary
– Meltem Sezen, Nanotechnology Research and Application Center, Sabanci University, Turkey
– Andrey Kudryavtsev, Exiton Analitik Co. Ltd., Saint Petersburg, Russia
IT2 - 3D imaging, image processing, and phase-related techniques
Light, electron and x-ray techniques will be included in this session for all cases of using serial sectioning, or/and phase rather than amplitude imaging, or/and computational methods for data acquisition, analysis and 3-D visualization. Contributions are welcome in any area of holography, diffraction imaging, tomography, nano-CT and micro-CT, confocal microscopies (multiphoton and electron), differential phase contrast imaging, structured illumination, and exit-wave reconstruction for the case of biological as well as non-biological samples. This section/symposium is anticipated also as a forum to discuss computational methods for processing large complex datasets in all kinds of microscopies and spectroscopies with the aim of improving spatial and temporal resolution, as well as precision and contrast for visualization of various types structural information.
– Ognjen Milat, Institute of Physics, Zagreb, Croatia
– Thomas Heuser, Vienna Bio Center, Vienna, Austria
IT3 - Diffraction techniques and spectroscopy
The session addresses methodology and implementation of electron diffraction and spectroscopy in characterization of various materials. Topics include contributions based on transmission and backscatter electron diffraction including diffraction tomography, and analytical techniques such as energy dispersive X-ray spectrometry, electron energy loss spectrometry, energy filtering, and cathodoluminescence. Contributions related to innovative/emerging techniques in electron diffraction and spectroscopies are highly encouraged.
– Mariana Klementova, Institute of Physics CAS, Prague, Czech Republic
– Miran Čeh, Center for Electron Microscopy and Microanalysis, Jozef Stefan Institute, Ljubljana, Slovenia
– Joke Hadermann, EMAT, University of Antwerp, Belgium
IT4 - Correlative, and super-resolution microscopy
– Ferdinand Hofer, Institut für Elektronenmikroskopie und Nanoanalytik, TU Graz, Graz, Austria
– Kristof Kovacs, Pannonia University, Veszprem, Hungary
IT5 - In situ and environmental microscopy
– Sašo Šturm, Department for Nanostructured Materials, Jozef Stefan Institute, Ljubljana, Slovenia
– Kónya Zoltán, Dept. of Applied and Environmental Chemistry, University of Szeged, Szeged, Hungary
IT6 - Advances in instrumentation and techniques (SEM, TEM, SPM, etc.)
This session intends to cover recent advances in all fields of electron microscopy, but also including scanning probe related techniques. The focus is mainly on the instrumentation developments and related advances in methodology. The session includes aberration correction and other resolution/contrast improvements for TEM and SEM, low voltage EM techniques, analytical methods, as well as all exciting new ideas on electron and probe microscopy.
– Daniel Kiener, Department Materialphysik, Universität Leoben, Leoben, Austria
– Vladislav Krzyzanek, Institute of Scientific Instruments CAS, Brno, Czech Republic
– Dr. Christoph Gammer, Erich Schmid Institute of Materials Science of the Austrian Academy of Sciences; Department Materials Physics, Montanuniversität Leoben, Leoben, Austria
– Dr. Ilona Muellerova, Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic